Electromigration Modeling at Circuit Layout Level (2013)
Electromigration Modeling at Circuit Layout Level (2013)
By Cher Ming Tan, Feifei He
Paperback
AED
291
00
AED 468.00
37% OFF
Free Delivery15 - 25 Nov
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (2011)
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (2011)
By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Paperback
AED
519
80
AED 1,077.00
51% OFF
Free Delivery15 - 25 Nov
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Hardcover
AED
523
42
AED 781.00
32% OFF
Free Delivery15 - 25 Nov
Need Help?
+971 6 731 0280
support@gzb.ae
About UsContact UsPayment MethodsFAQsShipping PolicyRefund and ReturnTerms of UsePrivacy PolicyCookie Notice
VisaMastercardCash on Delivery

© 2024 White Lion General Trading LLC. All rights reserved.